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Stable across regimes: A mixed DG method for Darcy–Brinkman–Stokes type flows2025 Computer Methods in Applied Mechanics and Engineering article Engineering Advanced Numerical Methods in Computational Mathematics Open access
Benjamin Terschanski, Robert Klöfkorn, Andreas Dedner, Julia Kowalski
2citations -
Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark2021 IEEE Transactions on Electron Devices article Engineering Advanced Memory and Neural Computing Open access
Giacomo Pedretti, Piergiulio Mannocci, Can Li, Zhong Sun, John Paul Strachan, Daniele Ielmini
11citations -
The Prism-Net Search Space Representation for Multi-objective Building Spatial Design2023 Lecture notes in computer science conference-paper Engineering Architecture and Computational Design Open access
Ksenia Pereverdieva, Michael Emmerich, Andre H. Deutz, Tessa Ezendam, Thomas Bäck, Hèrm Hofmeyer
4citations -
Fabrication of gate electrodes for scalable quantum computing using CMOS industry compatible e-beam lithography and numerical simulation of the resulting quantum device2023 European Mask and Lithography Conference (EMLC) conference-paper Engineering Advancements in Photolithography Techniques
Varvara Brackmann, Malte Neul, W. Langheinrich, Maik Simon, Pascal Muster, Sebastian Pregl, +11 more
2citations -
MedShapeNet – a large-scale dataset of 3D medical shapes for computer vision2024 Biomedizinische Technik/Biomedical Engineering article Engineering 3D Shape Modeling and Analysis Open access
Jianning Li, Zongwei Zhou, Jiancheng Yang, Antonio Pepe, Christina Gsaxner, Gijs Luijten, +93 more
36citations -
Heterosynaptic Plasticity and Neuromorphic Boolean Logic Enabled by Ferroelectric Polarization Modulated Schottky Diodes2022 Advanced Electronic Materials article Engineering Advanced Memory and Neural Computing Open access
Fengben Xi, Andreas Grenmyr, Jiayuan Zhang, Yi Han, Jin Hee Bae, Detlev Grützmacher, +1 more
17citations -
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations