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Radiation Effects in Electronics Sign in to save
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Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations -
Radiation Tolerance of Low-Noise Photoreceivers for the LISA Space Mission2024 IEEE Transactions on Nuclear Science article Engineering Radiation Effects in Electronics Open access
P Colcombet, Nicoleta Dinu-Jaeger, C. Inguimbert, Thierry Nuns, Sara Bruhier, Nelson L Christensen, +10 more
3citations
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