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Papers per year
Papers 72
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Online Junction Temperature Monitoring of Power Semiconductor Devices Based on a Wheatstone Bridge2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access
Niklas Fritz, Maximilian Friedel, Rik W. De Doncker, Timothy A. Polom
9citations -
The processing chain of the wide bandgap semiconductor SiC – How small steps enabled a mature technology2023 Diamond and Related Materials article Engineering Silicon Carbide Semiconductor Technologies Open access
Peter J. Wellmann, Johannes Steiner, Sven Strüber, Matthias Arzig, Michael Salamon, Norman Uhlmann, +2 more
9citations -
Balancing the Switching Losses of Paralleled SiC MOSFETs Using a Stepwise Gate Driver2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access
Christoph Lüdecke, Alireza Aghdaei, Michael Laumen, Rik W. De Doncker
9citations -
An Advanced 4-in Integrated Emitter Turn-off Thyristor With Ultralow Commutation Impedance to Achieve 8 kA Turn-off Capability: Comprehensive Analysis, Design, and Experiments2020 IEEE Transactions on Industrial Electronics article Engineering Silicon Carbide Semiconductor Technologies
Zhengyu Chen, Zhanqing Yu, Biao Zhao, Jiapeng Liu, Jie Shang, Rik W. De Doncker, +1 more
9citations -
A Sparsity-Promoting Time Domain Evaluation Method for Thermal Transient Measurement of Power Semiconductors2024 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies Open access cited by 1 patent
Yi Zhang, Anton Evgrafov, Shuai Zhao, Sven Kalker, Rik W. De Doncker
6citations -
Diagnosing Degradation in Power Modules Using Phase Delay Changes of Electrical Response2022 IEEE Annual Southern Power Electronics Conference conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access cited by 1 patent
Isabel Austrup, Christoph H. van der Broeck, Tianlong B. Albert, Sven Kalker, Rik W. De Doncker
6citations -
Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations2023 Journal of materials research/Pratt's guide to venture capital sources article Engineering Silicon Carbide Semiconductor Technologies Open access cited by 2 patents
Binh Duong Nguyen, Melissa Roder, A.N. Danilewsky, Johannes Steiner, Peter J. Wellmann, Stefan Sandfeld
5citations -
Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs2022 IEEE Annual Southern Power Electronics Conference conference-paper Engineering Silicon Carbide Semiconductor Technologies
Nguyen-Nghia Do, Sven Kalker, Isabel Austrup, Huang‐Jen Chiu, Rik W. De Doncker
5citations -
An Active Gate Driver for Iteratively Optimizing the Switching Characteristics of SiC MOSFETs2023 European Conference on Power Electronics and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies
Tobias Zekorn, Kenny Vohl, Ralf Wunderlich, Stefan J. Heinen
5citations -
SiC-Based dv/dt Generator for Insulation Testing with Fast and Adjustable Switching Transients2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies
Vivien Grau, Marcel Reisner, Stefan Quabeck, Rik W. De Doncker
5citations -
Diagnosing Thermal-Interface Aging of Power Devices Using Self-Sensing2024 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies
Isabel Austrup, Christoph H. van der Broeck, Sven Kalker, Tianlong B. Albert, Fabian Janoth, Rik W. De Doncker
4citations -
Diode-Assisted Gate-Commutated Thyristor for Hybrid MVDC Circuit Breaker Applications2023 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Silicon Carbide Semiconductor Technologies
Julia Warmuz, Seyedehsan AsadollahiAslTabrizKhah, Ala Qawasmi, Rik W. De Doncker
3citations -
Synthesis and Characterization of Nitrogen-Doped Crystallized SiC Films from Liquid Precursors2025 ACS Applied Electronic Materials article Engineering Silicon Carbide Semiconductor Technologies Open access
Benedikt Fischer, Maurice Nuys, Stefan Haas, Oliver Thimm, G. Schöpe, Pascal Foucart, +2 more
3citations
Most active Aachen authors
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Rik W. De Doncker 23,728 citations overall55 papers
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Sven Kalker 455 citations overall17 papers
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Christoph H. van der Broeck 1,346 citations overall16 papers
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Lukas A. Ruppert 351 citations overall8 papers
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Christoph Lüdecke 305 citations overall8 papers
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Michael Laumen 238 citations overall6 papers
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Isabel Austrup 23 citations overall6 papers
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Tianlong B. Albert 11 citations overall6 papers
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Stefan Sandfeld 1,951 citations overall5 papers
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L. Schmitz 142 citations overall5 papers
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Stefan J. Heinen 2,128 citations overall4 papers
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Ralf Wunderlich 2,124 citations overall4 papers
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Niklas Fritz 223 citations overall4 papers
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Tobias Kamp 39 citations overall4 papers
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Alireza Aghdaei 12 citations overall4 papers