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Integrated Circuits and Semiconductor Failure Analysis Sign in to save
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Multimodal In Situ Electron Microscopy Platform for Correlative Electro-Thermal Characterization and Failure Analysis2025 Proceedings - International Symposium for Testing and Failure Analysis conference-paper Engineering Integrated Circuits and Semiconductor Failure Analysis
Hongkui Zheng, Yevheniy V. Pivak, Christian Deen-van Rossum, Mia Andersen, Merijn Pen, Shibabrata Basak, +2 more
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Rüdiger‐A. Eichel 15,376 citations overall1 paper