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72
Aachen papers (primary topic)
57
Further papers (secondary topic)
878
Citations
66
Aachen authors
Papers per year
20
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26
Papers 72
Open in paper search →-
A Streamlined Test-Oriented Lifetime Assessment Framework for Automotive Power Electronics Converters2025 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies Open access
Sachin Kumar Bhoi, Sajib Chakraborty, Alireza Aghdaei, Anu Mathew, Tobias Daniel Horn, Sebastian Liebig, +4 more
3citations -
A 7 bit 5 A 6.7 GHz Gate-Shaping Digital Gate Driver with Burst-Sampling ADC for Iterative Switching Optimization of SiC Power MOSFETs2025 IEEE Applied Power Electronics Conference and Exposition (APEC) conference-paper Engineering Silicon Carbide Semiconductor Technologies
Tobias Zekorn, Kenny Vohl, Erik Wehr, Léon Weihs, Michael Hanhart, Ralf Wunderlich, +1 more
2citations -
Degradation Diagnosis During Active Power Cycling via Frequency-Domain Thermal Impedance Spectroscopy2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 2 patents
Sven Kalker, Johannes Holz, Isabel Austrup, Rik W. De Doncker
2citations -
Utilizing Electroluminescence of Silicon IGBTs for Junction Temperature Sensing2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Engineering Silicon Carbide Semiconductor Technologies
Lukas A. Ruppert, Bjarne Wirsen, Sven Kalker, Rik W. De Doncker
2citations -
A Fast-Response Reference Current Source for High- and Low-Side High-Voltage Current Mirrors for Gate-Shaping Digital Gate Drivers2023 Conference on Ph.D. Research in Microelectronics and Electronics conference-paper Engineering Silicon Carbide Semiconductor Technologies
Tobias Zekorn, Erik Wehr, Kenny Vohl, Ralf Wunderlich, Stefan J. Heinen
1citations -
Applicability of a Flat-Bed Birefringence Setup for the Determination of Threading Dislocations of Silicon Carbide Wafers2022 Materials science forum article Engineering Silicon Carbide Semiconductor Technologies Open access
Johannes Steiner, Binh Duong Nguyen, Melissa Roder, A.N. Danilewsky, Stefan Sandfeld, Peter J. Wellmann
0citations -
(Invited) Application of 3D in-Situ X-Ray Visualization to Track the Formation of Dislocation Clusters during PVT Growth of SiC2023 ECS Meeting Abstracts conference-abstract Engineering Silicon Carbide Semiconductor Technologies
Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle, Binh Duong Nguyen, Stefan Sandfeld, +2 more
0citations
Most active Aachen authors
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Rik W. De Doncker 23,728 citations overall55 papers
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Sven Kalker 455 citations overall17 papers
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Christoph H. van der Broeck 1,346 citations overall16 papers
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Lukas A. Ruppert 351 citations overall8 papers
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Christoph Lüdecke 305 citations overall8 papers
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Michael Laumen 238 citations overall6 papers
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Isabel Austrup 23 citations overall6 papers
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Tianlong B. Albert 11 citations overall6 papers
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Stefan Sandfeld 1,951 citations overall5 papers
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L. Schmitz 142 citations overall5 papers
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Stefan J. Heinen 2,128 citations overall4 papers
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Ralf Wunderlich 2,124 citations overall4 papers
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Niklas Fritz 223 citations overall4 papers
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Tobias Kamp 39 citations overall4 papers
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Alireza Aghdaei 12 citations overall4 papers