Hierarchical Memory Diagnosis

Proceedings/Proceedings - European Test Workshop, pp. 1–2

Abstract

High-quality memory diagnosis methodologies are critical enablers for scaled memory devices as they reduce time to market and provide valuable information regarding test escapes and customer returns. This paper presents an efficient Hierarchical Memory Diagnosis (HMD) approach that accurately diagnoses faults in the entire memory. Faults are diagnosed hierarchically; first, their location, then their nature (i.e., static or dynamic), and finally, their functional fault model. The HMD approach leads to a more accurate diagnostic, enabling the precise identification of yield loss causes.

Authors 6

1. Guilherme Cardoso Medeiros

   Delft University of Technology

   Affiliation as printed

   TU,Delft,The Netherlands

   TU, Delft, The Netherlands

2. Moritz Fieback

   Delft University of Technology

   Affiliation as printed

   TU,Delft,The Netherlands

   TU, Delft, The Netherlands

3. Anteneh Gebregiorgis

   Delft University of Technology

   Affiliation as printed

   TU,Delft,The Netherlands

   TU, Delft, The Netherlands

4. Mottaqiallah Taouil

   Delft University of Technology

   Affiliation as printed

   TU,Delft,The Netherlands

   TU, Delft, The Netherlands

5. Letícia Bolzani Poehls Aachen

   RWTH Aachen University

   Affiliation as printed

   IDS, RWTH,Aachen,Germany

   IDS, RWTH, Aachen, Germany

6. Said Hamdioui

   Delft University of Technology

   Affiliation as printed

   TU,Delft,The Netherlands

   TU, Delft, The Netherlands