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Papers 16
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Hard-to-Detect Fault Analysis in FinFET SRAMs2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui
15citations -
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations -
Improving the Detection of Undefined State Faults in FinFET SRAMs2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, T. Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, +1 more
1citations -
AIthena - D4.2 Report on physical set-up, digital twin and hybrid testing approaches2026 Zenodo (CERN European Organization for Nuclear Research) article Computer Science VLSI and Analog Circuit Testing Open access
Konstantinos Gkentsidis, Nil Munte, Guido Linden, Raul Sena Ferreira, Alexandru Forrai, Martijn Harmenzon, +3 more
0citations
16 results
Most active Aachen authors
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T. Copetti 284 citations overall10 papers
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L. M. Bolzani Poehls 198 citations overall8 papers
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Tobias Gemmeke 881 citations overall5 papers
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Letícia Bolzani Poehls 350 citations overall4 papers
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A. Chordia 3 citations overall2 papers
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Jakob Andert 2,134 citations overall1 paper
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Daniel Guse 264 citations overall1 paper
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Supriya Chakraborty 95 citations overall1 paper
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M. Nilovic 8 citations overall1 paper
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Guido Linden 0 citations overall1 paper