January 01, 2003 conference-paper FAME: a fault-pattern based memory failure analysis framework International Conference on Computer Aided Design DOI: 10.1109/iccad.2003.159743 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 11 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Hierarchical Memory Diagnosis 2022 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access 0 citations 1 result References 0