A failure analysis framework of ReRAM In-Memory Logic operations

IEEE International Test Conference in Asia (ITC-Asia), pp. 67–72

Abstract

Computation-in-Memory (CiM) with emerging non-volatile memories leads to significant performance and energy efficiency, which is a promising approach to address so-called memory wall of conventional von Neumann architectures. Redox-based Random access memory (ReRAM) is an appropriate candidate for the realization of CiM concepts in CMOS co-integrated crossbar structures. However, ReRAM devices suffer from inherent variability in fabrication and operation. In this paper, we propose a statistical failure probability framework for the reliability evaluation of ReRAM-based CiM. Based on this, a comprehensive reliability analysis is performed for logic operations in ReRAM-based Scouting and MAGIC concepts at the crossbar level. Our proposed framework shows that existing logic operation in the crossbar architecture has a high failure probability due to the variability and crossbar non-idealities. Hence, a modified crossbar design is proposed to achieve the target reliability requirements.

Authors 8

1. Leon Brackmann Aachen Institut für Werkstoffe der Elektrotechnik II

   RWTH Aachen University

   Affiliation as printed

   Institut für Werkstoffe der Elektrotechnik II RWTH Aachen,Aachen,Germany

2. Atousa Jafari

   Karlsruhe Institute of Technology

   Affiliation as printed

   KIT,Department of Computer Science,Karlsruhe,Germany

   Department of Computer Science, KIT, Karlsruhe, Germany

3. Christopher Bengel Aachen Institut für Werkstoffe der Elektrotechnik II

   RWTH Aachen University

   Affiliation as printed

   Institut für Werkstoffe der Elektrotechnik II RWTH Aachen,Aachen,Germany

4. Mahta Mayahinia

   Karlsruhe Institute of Technology

   Affiliation as printed

   KIT,Department of Computer Science,Karlsruhe,Germany

   Department of Computer Science, KIT, Karlsruhe, Germany

5. Rainer M. Waser Aachen Institut für Werkstoffe der Elektrotechnik II

   RWTH Aachen University

   Affiliation as printed

   Institut für Werkstoffe der Elektrotechnik II RWTH Aachen,Aachen,Germany

6. Dirk J. Wouters Aachen Institut für Werkstoffe der Elektrotechnik II

   RWTH Aachen University

   Affiliation as printed

   Institut für Werkstoffe der Elektrotechnik II RWTH Aachen,Aachen,Germany

7. Stephan Menzel

   Forschungszentrum Jülich

   Affiliation as printed

   Peter Grünberg Institut (PGI-7) Forschungszentrum Jülich,Jülich,Germany

8. Mehdi Baradaran Tahoori

   Karlsruhe Institute of Technology

   Affiliation as printed

   KIT,Department of Computer Science,Karlsruhe,Germany

   Department of Computer Science, KIT, Karlsruhe, Germany