March 01, 2019 conference-paper Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation Design, Automation, and Test in Europe DOI: 10.23919/date.2019.8714879 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 8 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A failure analysis framework of ReRAM In-Memory Logic operations 2022 IEEE International Test Conference in Asia (ITC-Asia) conference-paper Engineering Advanced Memory and Neural Computing 3 citations 1 result References 0