Statistical Fluctuations in HfOx Resistive-Switching Memory: Part I - Set/Reset Variability

IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2014.2330200 Full text (OA) OpenAlex

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Statistical Fluctuations in HfOx Resistive-Switching Memory: Part I - Set/Reset Variability

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Cited by 7 stored of 230

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