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Quick and robust PDF data acquisition using a laboratory single-crystal X-ray diffractometer for study of polynuclear lanthanide complexes in solid form and in solution2022 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography
Dmitry M. Tsymbarenko, Dimitry Grebenyuk, М. А. Бурлакова, Mirijam Zobel
32citations -
Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double-crystal deflector2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Oleg Konovalov, Valentina Rein, Mehdi Saedi, Irene M. N. Groot, Gilles Renaud, Maciej Jankowski
12citations -
Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Josef Simbrunner, Marten Huck, Armin Moser, Hans‐Georg Steinrück, Roland Resel
7citations -
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Jorid Smets, Josef Simbrunner, Mario Fratschko, Víctor Rubio‐Giménez, Rob Ameloot, Hans‐Georg Steinrück, +1 more
5citations -
Multidimensional Rietveld refinement of high-pressure neutron diffraction data of PbNCN2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Yannick Meinerzhagen, Katharina Eickmeier, Peter C. Müller, Jan Hempelmann, Andreas Houben, Richard Dronskowski
5citations -
The human factor: results of a small-angle scattering data analysis round robin2023 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Brian Richard Pauw, Glen J. Smales, Andy S. Anker, V. Annadurai, Daniel M. Balazs, Ralf Bienert, +42 more
4citations -
X-ray reflectivity from micrometre-scaled surfaces using nanobeams2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Vedran Vonk, Steffen Tober, Steven John Leake, Breno Rabelo Coutinho Saraiva, Lisa Randolph, Arti Dangwal Pandey, +3 more
1citations -
X-ray reflectivity from micrometre-scaled surfaces using nanobeams2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Vedran Vonk, Steffen Tober, Steven John Leake, Breno Rabelo Coutinho Saraiva, Lisa Randolph, Arti Dangwal Pandey, +3 more
0citations
9 results