X-ray reflectivity from micrometre-scaled surfaces using nanobeams

Journal of Applied Crystallography

Authors 9

1. Vedran Vonk
2. Steffen Tober
3. Steven John Leake
4. Breno Rabelo Coutinho Saraiva
5. Lisa Randolph
6. Arti Dangwal Pandey
7. Thomas Florian Keller
8. Hans‐Georg Steinrück Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen

9. Andreas Stierle