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Understanding Transistor Aging Impact on the Behavior of RRAM Cells2024 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Engineering Advanced Memory and Neural Computing
Seyed Hossein Hashemi Shadmehri, Supriya Chakraborty, T. Copetti, Fabian Luis Vargas, L. M. Bolzani Poehls
4citations -
Diagnosing Thermal-Interface Aging of Power Devices Using Self-Sensing2024 IEEE Transactions on Power Electronics article Engineering Electronic Packaging and Soldering Technologies
Isabel Austrup, Christoph H. van der Broeck, Sven Kalker, Tianlong B. Albert, Fabian Janoth, Rik W. De Doncker
4citations -
Modeling Endurance Degradation of VCM-based 1T1R ReRAM Cell for Circuit Simulations2026 International Symposium on Quality Electronic Design (ISQED) conference-paper Engineering Advanced Memory and Neural Computing
Supriya Chakraborty, Seyed Hossein Hashemi Shadmehri, T. Copetti, Tobias Gemmeke, L. M. Bolzani Poehls
0citations
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