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A Fast and Accurate True Event-driven Phase Locked Loop Model2020 IEEE International Conference on Electronics, Circuits and Systems (ICECS) conference-paper Engineering Advancements in PLL and VCO Technologies
Christoph Beyerstedt, Jonas Meier, Fabian Speicher, Markus Scholl, Daniel Blase, Ralf Wunderlich, +1 more
6citations -
Assessment of weathered rock effects on local seismic hazard using 2D dynamic numerical modeling: a case study of the Bukit Timah granite, Singapore2025 Geomatics Natural Hazards and Risk article Engineering Seismic Performance and Analysis Open access
Farkhod Hakimov, Hans‐Balder Havenith, Klaus R. Reicherter, Taeseo Ku, Shynggys Abdialim, Jong Ryeol Kim, +1 more
2citations -
High-precision optical constant characterization of materials in the EUV spectral range: from large research facilities to laboratory-based instruments2022 European Mask and Lithography Conference (EMLC) conference-paper Engineering Advancements in Photolithography Techniques
Victor Soltwisch, Sven Glabisch, Anna Andrle, Vicky Philipsen, Qais Saadeh, Sophia Schröder, +3 more
2citations -
Structural Disorder as the Origin of Optical Properties and Spectral Dynamics in Squaraine Nano-Aggregates2022 Journal of the American Chemical Society article Engineering Organic Electronics and Photovoltaics Open access
Robin Bernhardt, Marìck Manrho, Jennifer Zablocki, Lukas Rieland, Arne Lützen, Manuela Schiek, +5 more
19citations -
SBL-Based Hybrid Precoder/ Combiner Design for Power and Spectrally Efficient Millimeter Wave MIMO Systems2020 International Conference on Signal Processing and Communications (SPCOM) conference-paper Engineering Millimeter-Wave Propagation and Modeling
Suraj Srivastava, Amrita Mishra, Aditya K. Jagannatham, Gerd Ascheid
17citations -
Adaptive Cardiorespiratory Separation With Harmonic Models and Filters: The Case of Electrical Impedance Tomography2025 IEEE Transactions on Biomedical Engineering article Engineering Electrical and Bioimpedance Tomography
Diogo Silva, Thomas Muders, Sebastian Daniel Reinartz, Christian Putensen, Steffen K. Leonhardt
2citations -
Latent image characterization by spectroscopic reflectometry in the extreme ultraviolet2021 Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV conference-paper Engineering Advancements in Photolithography Techniques Open access
Sophia Schröder, Lukas Bahrenberg, Bernhard Lüttgenau, Sven Glabisch, Serhiy Danylyuk, Sascha Brose, +2 more
5citations