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Developing a Benchmark Grid Model for Future Congestion Management and Stability Analysis2024 IEEE PES Innovative Smart Grid Technologies Europe conference-paper Engineering Electric Power System Optimization
Fabian Meißner, Tobias Sous, Christian Ziesemann, Peter Wirtz, Florian Klein-Helmkamp, Albert Moser
5citations -
Shakedown limit of 316L stainless steel manufactured by laser powder bed fusion based on crystal plasticity enhanced direct cyclic analysis2025 International Journal of Fatigue article Engineering Additive Manufacturing Materials and Processes Open access
Xuemei Lyu, Felix Weber, Geng Chen, Jiali Zhang, Tobias Sedlatschek, Christoph Broeckmann
2citations -
Fabrication of gate electrodes for scalable quantum computing using CMOS industry compatible e-beam lithography and numerical simulation of the resulting quantum device2023 European Mask and Lithography Conference (EMLC) conference-paper Engineering Advancements in Photolithography Techniques
Varvara Brackmann, Malte Neul, W. Langheinrich, Maik Simon, Pascal Muster, Sebastian Pregl, +11 more
2citations -
A New Formulation of Dynamic-Phasor-Based State Estimation With Inclusion of an Equality Constraint2024 IEEE Transactions on Instrumentation and Measurement article Engineering Power System Optimization and Stability
Priyanka Arkalgud Ganeshamurthy, Sriram Karthik Gurumurthy, Ferdinanda Ponci, Antonello Monti
2citations -
Optimizing large-scale Integrated Energy Systems with Storage Facilities: A parallelized approach2024 Asia Conference on Power and Electrical Engineering (ACPEE) conference-paper Engineering Integrated Energy Systems Optimization
Raphaël Houben, Alexander Bobekh, Felix Preuschoff, Albert Moser
2citations -
Investigation of stochastic roughness effects for nanoscale grating characterization with a stand-alone EUV spectrometer2022 SPIE Photomask Technology Conference conference-paper Engineering Advancements in Photolithography Techniques
Sven Glabisch, Sophia Schröder, Sascha Brose, Henning Heiming, Jochen Stollenwerk, Carlo Holly
1citations -
Broadband scatterometry at extreme ultraviolet wavelengths for nanograting characterization2021 Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV conference-paper Engineering Advancements in Photolithography Techniques
Seyed moein Ghafoori, Lukas Bahrenberg, Sven Glabisch, Sophia Schroeder, Serhiy Danylyuk, Sascha Brose, +3 more
1citations