Interpolative Metric Learning for Few-Shot Specific Emitter Identification

IEEE Transactions on Vehicular Technology, vol. 72, pp. 16851–16855

Abstract

Specific emitter identification (SEI) is a potential physical layer authentication technology, which is one of the most critical complements of upper layer authentication. Radio frequency fingerprint (RFF)-based SEI is to distinguish one emitter from each other by immutable RF characteristics from electronic components. Due to the powerful ability of deep learning (DL) to extract hidden features and perform classification, it can extract highly separative features from massive signal samples, thus enabling SEI. Considering the condition of limited training samples, we propose a novel few-shot SEI (FS-SEI) method based on interpolative metric learning (InterML) which gets rid of the dependence on auxiliary dataset. Specifically, InterML is designed to mine more implicit samples in the sample space to improve generalization, and constrain the feature distance in the feature space to improve discriminability. The proposed InterML-based FS-SEI method is evaluated on a real-world Wi-Fi dataset. The simulation results show that the proposed method achieves better identification performance, higher feature discriminability and more stable performance than five latest FS-SEI methods. In the 10 shot scenario, the identification accuracy of InterML is 91.48%, compared to the comparison methods, the accuracy is improved by 0.62%–31.29%.

Authors 7

1. Cheng Wang

   Nanjing University of Posts and Telecommunications

   Affiliation as printed

   College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China

2. Xue Gang Fu

   Nanjing University of Posts and Telecommunications

   Affiliation as printed

   College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China

3. Yu Wang

   Nanjing University of Posts and Telecommunications

   Affiliation as printed

   College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China

4. Guan Gui

   Nanjing University of Posts and Telecommunications

   Affiliation as printed

   College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China

5. Haris Gacanin Aachen Institute for Communication Technologies and Embedded Systems

   RWTH Aachen University

   Affiliation as printed

   Institute for Communication Technologies and Embedded Systems, RWTH Aachen University, Aachen, Germany

6. Hikmet Sari

   Nanjing University of Posts and Telecommunications

   Affiliation as printed

   College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, China

7. Fumiyuki Adachi

   Tohoku University

   Affiliation as printed

   International Research Institute of Disaster Science (IRIDeS), Tohoku University, Sendai, Japan