A

How to report and benchmark emerging field-effect transistors

Nature Electronics, vol. 5, pp. 416–423

Authors 15

  1. Zhihui Cheng corresponding

    National Institute of Standards and Technology · Purdue University West Lafayette

    Affiliation as printed

    Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

    Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, USA

  2. Purdue University West Lafayette

    Affiliation as printed

    Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

  3. University of California, Los Angeles

    Affiliation as printed

    Department of Chemistry and Biochemistry, University of California, Los Angeles, Los Angeles, CA, USA

  4. Peking University

    Affiliation as printed

    School of Integrated Circuits, Peking University, Beijing, China

  5. New York University

    Affiliation as printed

    Center for Quantum Phenomena, Physics Department, New York University, New York, NY, USA

    Electrical and Computer Engineering, New York University, Brooklyn, NY, USA

  6. IMEC

    Affiliation as printed

    IMEC, Leuven, Belgium

  7. AMO (Germany) · RWTH Aachen University

    Affiliation as printed

    AMO GmbH, Advanced Microelectronic Center Aachen, Aachen, Germany

    RWTH Aachen University, Chair of Electronic Devices, Aachen, Germany

  8. Peking University

    Affiliation as printed

    Key Laboratory for the Physics and Chemistry of Nanodevices and Center for Carbon-based Electronics, Department of Electronics, Peking University, Beijing, China

  9. University of California, Los Angeles

    Affiliation as printed

    Department of Chemistry and Biochemistry, University of California, Los Angeles, Los Angeles, CA, USA

  10. Purdue University West Lafayette

    Affiliation as printed

    Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

  11. Purdue University West Lafayette

    Affiliation as printed

    Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA

  12. University of Minnesota

    Affiliation as printed

    Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA

  13. Stanford University

    Affiliation as printed

    Department of Electrical Engineering, Stanford University, Stanford, CA, USA

  14. Aaron D. Franklin corresponding

    Duke University

    Affiliation as printed

    Department of Chemistry, Duke University, Durham, NC, USA

    Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA

  15. Curt A. Richter corresponding

    National Institute of Standards and Technology

    Affiliation as printed

    Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, USA

Cited by 184 stored of 185

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References 68