How to report and benchmark emerging field-effect transistors
Nature Electronics, vol. 5, pp. 416–423
Authors 15
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Zhihui Cheng corresponding
National Institute of Standards and Technology · Purdue University West Lafayette
Affiliation as printed
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, USA
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Purdue University West Lafayette
Affiliation as printed
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
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University of California, Los Angeles
Affiliation as printed
Department of Chemistry and Biochemistry, University of California, Los Angeles, Los Angeles, CA, USA
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Affiliation as printed
School of Integrated Circuits, Peking University, Beijing, China
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Affiliation as printed
Center for Quantum Phenomena, Physics Department, New York University, New York, NY, USA
Electrical and Computer Engineering, New York University, Brooklyn, NY, USA
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Affiliation as printed
IMEC, Leuven, Belgium
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AMO (Germany) · RWTH Aachen University
Affiliation as printed
AMO GmbH, Advanced Microelectronic Center Aachen, Aachen, Germany
RWTH Aachen University, Chair of Electronic Devices, Aachen, Germany
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Affiliation as printed
Key Laboratory for the Physics and Chemistry of Nanodevices and Center for Carbon-based Electronics, Department of Electronics, Peking University, Beijing, China
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University of California, Los Angeles
Affiliation as printed
Department of Chemistry and Biochemistry, University of California, Los Angeles, Los Angeles, CA, USA
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Purdue University West Lafayette
Affiliation as printed
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
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Purdue University West Lafayette
Affiliation as printed
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA
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Affiliation as printed
Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USA
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Affiliation as printed
Department of Electrical Engineering, Stanford University, Stanford, CA, USA
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Aaron D. Franklin corresponding
Affiliation as printed
Department of Chemistry, Duke University, Durham, NC, USA
Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
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Curt A. Richter corresponding
National Institute of Standards and Technology
Affiliation as printed
Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD, USA
Cited by 184 stored of 185
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