July 02, 2026 article Process dependent stress analysis & performance enhancement by replacing SiGe SL in Si/SiGe stack for n-type Si nanosheet based FETs Micro and Nanostructures DOI: 10.1016/j.micrna.2026.208831 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access How to report and benchmark emerging field-effect transistors 2022 Nature Electronics article Materials Science 2D Materials and Applications Open access 185 citations 1 result