August 13, 2015 article Open access Prebond Testing of Weak Defects in TSVs IEEE Transactions on Very Large Scale Integration (VLSI) Systems DOI: 10.1109/tvlsi.2015.2448594 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 15 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Low-Power Technique for Yield-Enhanced 3D Interconnects 2022 Springer eBooks book-chapter Engineering 3D IC and TSV technologies 1 citations 1 result References 0