May 25, 2012 article Metal–Oxide RRAM Proceedings of the IEEE DOI: 10.1109/jproc.2012.2190369 OpenAlex Authors 0 Author list not loaded yet. Cited by 27 stored of 2,759 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Enhanced Resistive Switching Uniformity in Tantalum Oxide Memristor Devices via Copper Implantation 2026 Advanced Electronic Materials article Engineering Advanced Memory and Neural Computing Open access 0 citations Modeling Endurance Degradation of VCM-based 1T1R ReRAM Cell for Circuit Simulations 2026 International Symposium on Quality Electronic Design (ISQED) conference-paper Engineering Advanced Memory and Neural Computing 0 citations Technology Roadmap of Bioinspired Computing Hardware 2026 ACS Nano article Engineering Advanced Memory and Neural Computing Open access 13 citations Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs 2025 Microelectronics Reliability article Computer Science VLSI and Analog Circuit Testing Open access 1 citations 3D kinetic Monte Carlo-based investigation of the influence of dopants on the reliability of VCM ReRAM 2025 Journal of Applied Physics article Engineering Advanced Memory and Neural Computing Open access 4 citations Lifecycle Management of RRAMs: Quality and Reliability 2024 conference-paper Engineering Advanced Memory and Neural Computing 1 citations A Calibratable Model for Fast Energy Estimation of MVM Operations on RRAM Crossbars 2024 conference-paper Engineering Advanced Memory and Neural Computing 6 citations A Fully Automated Platform for Evaluating ReRAM Crossbars 2024 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing 7 citations Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs 2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 2 citations A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing 2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access 10 citations Accurate evaluation method for HRS retention of VCM ReRAM 2024 APL Materials article Engineering Advanced Memory and Neural Computing Open access 8 citations In Operando Near‐Field Optical Investigation of Memristive Ta2O5 Thin Film Devices with a Graphene Top Electrode 2024 Advanced Functional Materials article Engineering Advanced Memory and Neural Computing Open access 5 citations Dual‐Mode Operation of Epitaxial Hf 0.5 Zr 0.5 O 2 : Ferroelectric and Filamentary‐Type Resistive Switching 2023 physica status solidi (a) article Engineering Ferroelectric and Negative Capacitance Devices Open access 13 citations Evaluating a New RRAM Manufacturing Test Strategy 2023 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 9 citations Strategies to Control the Relaxation Kinetics of Ag‐Based Diffusive Memristors and Implications for Device Operation 2022 Advanced Electronic Materials article Engineering Advanced Memory and Neural Computing Open access 27 citations A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs 2022 ACM Journal on Emerging Technologies in Computing Systems article Engineering Advanced Memory and Neural Computing cited by 10 patents 21 citations Chemical Structure of Conductive Filaments in Tantalum Oxide Memristive Devices and Its Implications for the Formation Mechanism 2022 Advanced Electronic Materials article Engineering Advanced Memory and Neural Computing Open access 43 citations Effect of the Threshold Kinetics on the Filament Relaxation Behavior of Ag‐Based Diffusive Memristors 2021 Advanced Functional Materials article Engineering Advanced Memory and Neural Computing Open access 135 citations Evaluating the Impact of Process Variation on RRAMs 2021 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing Open access 15 citations Comprehensive Model of Electron Conduction in Oxide-Based Memristive Devices 2021 ACS Applied Electronic Materials article Engineering Advanced Memory and Neural Computing Open access 157 citations 1–20 of 27 Page 1 / 2 Next → References 0