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Voltage-controlled three-electron-beam interference by a three-element Boersch phase shifter with top and bottom shielding electrodes2021 International Vacuum Nanoelectronics Conference conference-paper Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications
Pooja Thakkar, Vitaliy A. Guzenko, Peng‐Han Lu, Rafal E. Dunin‐Borkowski, Jan Pieter Abrahams, Soichiro Tsujino
1citations -
Analysis of VMM Operations on 1S1R Crossbar Arrays and the Influence of Wire Resistances2022 IEEE International Symposium on Circuits and Systems proceedings conference-paper Engineering Advanced Memory and Neural Computing
Rana Walied Ahmad, Dirk J. Wouters, Christopher Bengel, Rainer M. Waser, Stephan Menzel
6citations
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