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High-precision optical constant characterization of materials in the EUV spectral range: from large research facilities to laboratory-based instruments2022 European Mask and Lithography Conference (EMLC) conference-paper Engineering Advancements in Photolithography Techniques
Victor Soltwisch, Sven Glabisch, Anna Andrle, Vicky Philipsen, Qais Saadeh, Sophia Schröder, +3 more
2citations -
Design and realization of an in-lab EUV dual beamline for industrial and scientific applications2021 International Conference on Extreme Ultraviolet Lithography conference-paper Engineering Advancements in Photolithography Techniques
Bernhard Lüttgenau, Sascha Brose, Serhiy Danylyuk, Jochen Stollenwerk, Peter Loosen, Carlo Holly
3citations
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