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Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations -
Integrating Real-World Data and Computational Guidelines: Designing a Dashboard for Nationwide Evaluation of Molecular Diagnostics in Oncology2025 Studies in health technology and informatics book-chapter Health Professions Electronic Health Records Systems Open access
Robin Pasman, F. Jacobs, Rik Eshuis, Cor Doede de Kroon, Matthijs Sloep, Jurrian van der Werf, +1 more
0citations -
On the applicability of hybrid systems safety verification tools from the automotive perspective2023 International Journal on Software Tools for Technology Transfer book-chapter Computer Science Formal Methods in Verification Open access
Stefan Schupp, Erika Ábrahám, Md Tawhid Bin Waez, Thomas Rambow, Zeng Qiu
3citations -
Infrastructures and Transformation: Between Path Dependency and Opening-Up for Experimental Change2024 Springer eBooks book-chapter Environmental Science Sustainability and Climate Change Governance Open access
Stefan Böschen, Sarah Hermens, Eva-Maria Jakobs, Frank Lohrberg, Reinhard Madlener, Susanne Mütze‐Niewöhner, +2 more
2citations
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