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DeltaKWS: A 65nm 36nJ/Decision Bio-inspired Temporal-Sparsity-Aware Digital Keyword Spotting IC with 0.6V Near-Threshold SRAM2024 arXiv (Cornell University) preprint Engineering Low-power high-performance VLSI design Open access
Qinyu Chen, Kwantae Kim, Chang Gao, S. Kevin Zhou, Taekwang Jang, Tobi Delbrück, +1 more
0citations -
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations -
Hard-to-Detect Fault Analysis in FinFET SRAMs2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui
15citations -
Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark2021 IEEE Transactions on Electron Devices article Engineering Advanced Memory and Neural Computing Open access
Giacomo Pedretti, Piergiulio Mannocci, Can Li, Zhong Sun, John Paul Strachan, Daniele Ielmini
11citations -
Slicing Match-Action Pipeline Resources for Multitenancy on Programmable Switches2025 IEEE International Conference on Network Softwarization (NetSoft) conference-paper Computer Science Software-Defined Networks and 5G
Johannes Krude, Felix Frei, Pedram Ahmadiyeh, René Glebke, Mirko Stoffers, Klaus Wehrle
1citations -
Improving the Detection of Undefined State Faults in FinFET SRAMs2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, T. Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, +1 more
1citations -
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations -
An Energy-Efficient and Area-Efficient Depthwise Separable Convolution Accelerator with Minimal On-Chip Memory Access2023 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science Advanced Neural Network Applications
Yi Chen, Jie Lou, Christian Lanius, Florian Freye, Johnson Loh, Tobias Gemmeke
7citations -
Analog In-Memory Computing Attention Mechanism for Fast and Energy-Efficient Large Language Models2024 JuSER (Forschungszentrum Jülich) article Engineering Advanced Memory and Neural Computing Open access
Nathan Leroux, Paul-Philipp Manea, Chirag Sudarshan, Jan Finkbeiner, Sebastian Siegel, John Paul Strachan, +1 more
0citations -
Impact of memory device precision in analog combinatorial optimization solvers2026 npj Unconventional Computing article Engineering Advanced Memory and Neural Computing Open access
Mohammad Hizzani, Ming-Jay Yang, Arne Heittmann, George Higgins Hutchinson, Dmitri B. Strukov, John Paul Strachan
0citations
15 results