Papers matching “X-ray diffraction measurement” 148
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Residual stress measurement of physical vapor deposition (PVD) AlTiN thin films - a comparative study of x-Ray diffraction-, Raman spectroscopic and ring core method2026 The International Journal of Advanced Manufacturing Technology article Engineering Metal and Thin Film Mechanics Open access
Hilke Petersen, Arnd Heckemeyer, Bernd Breidenstein, Christoph Kahra, Sebastian Herbst, Finn Rümenapf, +10 more
0citations -
Residual stress measurement of physical vapor deposition (PVD) AlTiN thin films - a comparative study of x-Ray diffraction-, Raman spectroscopic and ring core method2026 The International Journal of Advanced Manufacturing Technology article Engineering Metal and Thin Film Mechanics Open access
Hilke Petersen, Arnd Heckemeyer, Bernd Breidenstein, Christoph Kahra, Sebastian Herbst, Finn Rümenapf, +10 more
1citations -
Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Josef Simbrunner, Marten Huck, Armin Moser, Hans‐Georg Steinrück, Roland Resel
7citations -
BEaTriX, the new facility to measure the modular X-ray optics of the ATHENA telescope with an expanded and parallel X-ray beam2023 International Conference on Space Optics (ICSO) conference-paper Physics and Astronomy Astronomy and Astrophysical Research Open access
Stefano Basso, Bianca Salmaso, Daniele Spiga, M. Ghigo, G. Vecchi, Giorgia Sironi, +30 more
0citations