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Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Josef Simbrunner, Marten Huck, Armin Moser, Hans‐Georg Steinrück, Roland Resel
7citations -
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Jorid Smets, Josef Simbrunner, Mario Fratschko, Víctor Rubio‐Giménez, Rob Ameloot, Hans‐Georg Steinrück, +1 more
5citations -
Towards quantitative evaluation of grazing-incidence X-ray diffraction data2026 Acta Crystallographica Section A Foundations and Advances article Materials Science X-ray Diffraction in Crystallography Open access
F. Gasser, S. John, J. Smets, J. Simmbrunner, M. Fratschko, R. Ameloot, +2 more
0citations -
Temperature-dependent deformation behavior of the additively manufactured Al0.75CrFeNi2.1 alloy using in-situ high energy X-ray diffraction2025 Journal of Alloys and Compounds article Engineering Intermetallics and Advanced Alloy Properties Open access
Ivan Cazic, Pere Barriobero Vila, Niloofar Navaeilavasani, Andreas Stark, Norbert Schell, J. Ghanbaja, +2 more
0citations -
The impact of scanning strategy on cell structures in PBF-LB/M/IN718: an in situ synchrotron x-ray diffraction study2025 Journal of Materials Research and Technology article Engineering Additive Manufacturing Materials and Processes Open access
Benoît Ferrari, Andrea Fantin, Diego Said Schicchi, Andrew Nicholas Fitch, Patricia Suárez Ocaño, Tatiana Mishurova, +8 more
6citations -
BEaTriX, the new facility to measure the modular X-ray optics of the ATHENA telescope with an expanded and parallel X-ray beam2023 International Conference on Space Optics (ICSO) conference-paper Physics and Astronomy Astronomy and Astrophysical Research Open access
Stefano Basso, Bianca Salmaso, Daniele Spiga, M. Ghigo, G. Vecchi, Giorgia Sironi, +30 more
0citations -
Residual stress measurement of physical vapor deposition (PVD) AlTiN thin films - a comparative study of x-Ray diffraction-, Raman spectroscopic and ring core method2026 The International Journal of Advanced Manufacturing Technology article Engineering Metal and Thin Film Mechanics Open access
Hilke Petersen, Arnd Heckemeyer, Bernd Breidenstein, Christoph Kahra, Sebastian Herbst, Finn Rümenapf, +10 more
0citations -
Multi-technique analysis, correlation between ultrasound and x-ray diffraction on commercial cells2023 HAL (Le Centre pour la Communication Scientifique Directe) conference-paper Engineering Ultrasonics and Acoustic Wave Propagation Open access
Benjamin Mercier‐Guyon, Corentin Rénais, Maxime Servajon, Morian Sonnet, David Wasylowski, Sandrine Lyonnard, +1 more
0citations -
The impact of scanning strategy on cell structures in PBF-LB/M/IN718: an in situ synchrotron x-ray diffraction study2026 Journal of Materials Research and Technology article Engineering Additive Manufacturing Materials and Processes Open access
B. Ferrari, A. Fantin, D. Said, A. Fitch, P. Suárez Ocano, T. Mishurova, +6 more
0citations -
Single-crystal neutron and X-ray diffraction study of garnet-type solid-state electrolyte Li6La3ZrTaO12: an in situ temperature-dependence investigation (2.5 ≤ T ≤ 873 K)2021 Acta Crystallographica Section B Structural Science Crystal Engineering and Materials article Engineering Advanced Battery Materials and Technologies Open access
Günther Josef Redhammer, Martin Meven, Steffen Ganschow, Gerold Tippelt, Daniel Rettenwander
10citations