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Automated analysis of X-ray topography of 4H-SiC wafers: Image analysis, numerical computations, and artificial intelligence approaches for locating and characterizing screw dislocations2023 Journal of materials research/Pratt's guide to venture capital sources article Engineering Silicon Carbide Semiconductor Technologies Open access cited by 2 patents
Binh Duong Nguyen, Melissa Roder, A.N. Danilewsky, Johannes Steiner, Peter J. Wellmann, Stefan Sandfeld
5citations -
Dynamic Time Warping Clustering to Discover Socioeconomic Characteristics in Smart Water Meter Data2021 Journal of Water Resources Planning and Management article Engineering Water Systems and Optimization Open access
David Bernhard Steffelbauer, Mirjam Blokker, Steven G. Buchberger, Arno Knobbe, Edo Abraham
18citations -
Particle velocity measurement in powder gas jets of coaxial powder nozzles for laser material deposition2020 Journal of Laser Applications article Engineering Additive Manufacturing Materials and Processes
Jonathan Schaible, Luis Andrea Hau, Thomas Schopphoven, C. Haefner, Johannes Henrich Schleifenbaum
13citations