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Residual stress measurement of physical vapor deposition (PVD) AlTiN thin films - a comparative study of x-Ray diffraction-, Raman spectroscopic and ring core method2026 The International Journal of Advanced Manufacturing Technology article Engineering Metal and Thin Film Mechanics Open access
Hilke Petersen, Arnd Heckemeyer, Bernd Breidenstein, Christoph Kahra, Sebastian Herbst, Finn Rümenapf, +10 more
1citations -
Volume Contraction Upon Resistive Switching in Cr‐Doped V 2 O 3 as a Key Mechanism for Mottronics Applications2025 Advanced Electronic Materials article Engineering Advanced Memory and Neural Computing Open access
Danylо Babich, Julien Tranchant, Coline Adda, B. Corraze, Marie‐Paule Besland, Peter Warnicke, +9 more
3citations -
Electrochemical Activation of LiGaO2: Implications for Ga-Doped Garnet Solid Electrolytes in Li-Metal Batteries2024 ACS Applied Materials & Interfaces article Engineering Advanced Battery Materials and Technologies Open access
Anna Windmüller, Kristian Schaps, Frederik Zantis, Anna Domgans, Bereket Woldegbreal Taklu, Tingting Yang, +9 more
8citations -
Synthesis and Characterization of Nitrogen-Doped Crystallized SiC Films from Liquid Precursors2025 ACS Applied Electronic Materials article Engineering Silicon Carbide Semiconductor Technologies Open access
Benedikt Fischer, Maurice Nuys, Stefan Haas, Oliver Thimm, G. Schöpe, Pascal Foucart, +2 more
4citations
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