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A review of the internal short circuit mechanism in lithium‐ion batteries: Inducement, detection and prevention2021 International Journal of Energy Research article Engineering Advanced Battery Technologies Research
Lili Huang, Lishuo Liu, Languang Lu, Xuning Feng, Xuebing Han, Weihan Li, +5 more
197citations -
DualConvMesh-Net: Joint Geodesic and Euclidean Convolutions on 3D Meshes2020 IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings conference-paper Engineering 3D Shape Modeling and Analysis Open access
Jonas Schult, Francis Engelmann, Theodora Kontogianni, Bastian Leibe
83citations -
UTILE-Pore: Deep Learning-Enabled 3D Analysis of Porous Materials in Polymer Electrolyte Membrane-Based Energy Devices2025 Journal of The Electrochemical Society article Engineering Fuel Cells and Related Materials Open access
André Colliard-Granero, Salvatore Ranieri, Aimy Bazylak, Tobias Morawietz, K. Andreas Friedrich, Jasna Janković, +3 more
5citations -
TRANSVERSE-EPT: A LOCAL FIRST ORDER ELECTRICAL PROPERTIES TOMOGRAPHY APPROACH NOT REQUIRING ESTIMATION OF THE INCIDENT FIELDS2021 Progress In Electromagnetics Research M article Engineering Electrical and Bioimpedance Tomography Open access
Reijer Leijsen, Wyger M. Brink, Xin An, ANDREW G. WEBB, Rob Remis
3citations -
Enhancement of an Experimental Methodology for the Investigation of Contact Heat Transfer at High Pressures2022 Journal of Fluid Flow Heat and Mass Transfer article Engineering Heat Transfer and Numerical Methods Open access
Tim Göttlich, Thorsten Helmig, Nicklas Gerhard, Thomas Bergs, Reinhold Kneer
1citations -
Experimental Investigation of Contact Heat Transfer at High Pressures2022 Proceedings of the ... International Conference on Fluid Flow, Heat and Mass Transfer conference-paper Engineering Heat Transfer and Numerical Methods Open access
Tim Göttlich, Thorsten Helmig, Nicklas Gerhard, Thomas Bergs, Reinhold Kneer
1citations -
Broadband scatterometry at extreme ultraviolet wavelengths for nanograting characterization2021 Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV conference-paper Engineering Advancements in Photolithography Techniques
Seyed moein Ghafoori, Lukas Bahrenberg, Sven Glabisch, Sophia Schroeder, Serhiy Danylyuk, Sascha Brose, +3 more
1citations