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Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations -
Beneath the SURFace: An MRI-like View into the Life of a 21st Century Datacenter2020 Zenodo (CERN European Organization for Nuclear Research) dataset Computer Science Cloud Computing and Resource Management Open access
Kristian Valur Laursen Olason, Alexandru Uta, Alexandru Iosup, Paul Melis, Damian Podareanu, Valeriu Codreanu
4citations -
Beneath the SURFace: An MRI-like View into the Life of a 21st Century Datacenter2020 Zenodo (CERN European Organization for Nuclear Research) dataset Computer Science Cloud Computing and Resource Management Open access
Alexandru Uta, Alexandru Iosup, Paul Melis, Damian Podareanu, Valeriu Codreanu
2citations