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Improving the Detection of Undefined State Faults in FinFET SRAMs2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, T. Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, +1 more
1citations -
Hard-to-Detect Fault Analysis in FinFET SRAMs2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui
15citations -
A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging2025 e-Journal of Nondestructive Testing article Computer Science Image and Signal Denoising Methods Open access
Virginia Florian, Jiayang Shi, Willem Jan Palestijn, Daniël M. Pelt, K. Joost Batenburg, Thomas Lang, +5 more
0citations -
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations -
OCCUQ: Exploring Efficient Uncertainty Quantification for 3D Occupancy Prediction2025 Proceedings - IEEE International Conference on Robotics and Automation/Proceedings conference-paper Computer Science Adversarial Robustness in Machine Learning Open access
Severin Heidrich, Till Beemelmanns, Bastian Leibe, Lutz Eckstein
3citations
12 results