January 01, 2026 book-chapter Pixels to properties Elsevier eBooks DOI: 10.1016/b978-0-443-22256-6.00004-x OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 8 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Aachen-Heerlen annotated steel microstructure dataset 2021 Scientific Data data-paper Engineering Microstructure and Mechanical Properties of Steels Open access 25 citations Machine Learning‐Enabled Tomographic Imaging of Chemical Short‐Range Atomic Ordering 2024 Advanced Materials article Engineering Advanced Materials Characterization Techniques Open access 23 citations A Machine Learning Framework for Quantifying Chemical Segregation and Microstructural Features in Atom Probe Tomography Data 2023 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 20 citations Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 15 citations Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure–activity relationships in electrocatalysts 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 8 citations The TOMO Project – Integrating a Fully Functional Atom Probe in an Aberration-Corrected TEM 2023 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 8 citations Can unsupervised machine learning boost the on-site analysis of in situ synchrotron diffraction data? 2022 Scripta Materialia article Materials Science Machine Learning in Materials Science Open access 6 citations Computer vision assisted decomposition analysis of atom probe tomography data 2023 Journal of Physics D Applied Physics article Engineering Advanced Materials Characterization Techniques Open access 3 citations 8 results