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September 16, 2025 article

An Effective Faults Detection Method for RRAM Application

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3602019 OpenAlex

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Cited by 0 stored of 2

References 5

Evaluating the Impact of Process Variation on RRAMs
2021 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing Open access

15

citations
Hard-to-Detect Fault Analysis in FinFET SRAMs
2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access

15

citations
Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs
2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

14

citations
Evaluating a New RRAM Manufacturing Test Strategy
2023 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

9

citations
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs
2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

7

citations

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