November 03, 2024 conference-paper Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs DOI: 10.1109/itc51657.2024.00059 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 4 References 2 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs 2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents 14 citations Characterization and Test of Intermittent Over RESET in RRAMs 2023 Proceedings - Asian Test Symposium/Proceedings conference-paper Computer Science VLSI and Analog Circuit Testing Open access 2 citations 2 results