Comparative Performance of Mos2 Transistors: Statistical Study and One-Transistor-One-Resistive Memory Integration

SSRN Electronic Journal

Authors 8

1. Fatemeh Khorramshahi corresponding

   VTT Technical Research Centre of Finland

   Affiliation as printed

   VTT Technical Research Centre of Finland

   VTT Technical Research Centre of Finland, FIN-02044 VTT, Finland

2. Heorhii Bohuslavskyi
   Affiliation as printed

   Independent - affiliation not provided to SSRN

3. Anton Murros

   VTT Technical Research Centre of Finland

   Affiliation as printed

   VTT Technical Research Centre of Finland

   VTT Technical Research Centre of Finland, FIN-02044 VTT, Finland

4. Agata Piacentini Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen University

   RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany

5. M. Heuken
   Affiliation as printed

   Independent - affiliation not provided to SSRN

6. Max C. Lemme Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen University

   RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany

7. Daniel Neumaier

   University of Wuppertal

   Affiliation as printed

   Bergische Universitat Wuppertal

   Bergische Universitat Wuppertal, Gaussstrasse 20, Wuppertal, 42119, Germany

8. Karl‐Magnus Persson

   VTT Technical Research Centre of Finland

   Affiliation as printed

   VTT Technical Research Centre of Finland

   VTT Technical Research Centre of Finland, FIN-02044 VTT, Finland