Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy

Microscopy and Microanalysis, vol. 29, pp. 1077–1086

Abstract

Chemically resolved atomic resolution imaging can give fundamental information about material properties. However, even today, a technique capable of such achievement is still only an ambition. Here, we take further steps in developing the analytical field ion microscopy (aFIM), which combines the atomic spatial resolution of field ion microscopy (FIM) with the time-of-flight spectrometry of atom probe tomography (APT). To improve the performance of aFIM that are limited in part by a high level of background, we implement bespoke flight path time-of-flight corrections normalized by the ion flight distances traversed in electrostatic simulations modeled explicitly for an atom probe chamber. We demonstrate effective filtering in the field evaporation events upon spatially and temporally correlated multiples, increasing the mass spectrum's signal-to-background. In an analysis of pure tungsten, mass peaks pertaining to individual W isotopes can be distinguished and identified, with the signal-to-background improving by three orders of magnitude over the raw data. We also use these algorithms for the analysis of a CoTaB amorphous film to demonstrate application of aFIM beyond pure metals and binary alloys. These approaches facilitate elemental identification of the FIM-imaged surface atoms, making analytical FIM more precise and reliable.

Authors 7

1. Felipe F. Morgado corresponding

   Max-Planck-Institut für Nachhaltige Materialien

   Affiliation as printed

   Department of Metal Physics and Alloy Design, Max Planck Institut für Eisenforschung GmbH , Düsseldorf 40237 , Germany

2. Leigh T. Stephenson

   Max-Planck-Institut für Nachhaltige Materialien

   Affiliation as printed

   Department of Metal Physics and Alloy Design, Max Planck Institut für Eisenforschung GmbH , Düsseldorf 40237 , Germany

3. Loïc Rousseau

   Centre National de la Recherche Scientifique · Groupe de Physique des Matériaux · Institut National des Sciences Appliquées Rouen Normandie

   Affiliation as printed

   Groupe de Physique des Matériaux, University and INSA of Rouen, CNRS, Normandie University , Avenue de l'université, Rouen 76000 , France

4. François Vurpillot

   Centre National de la Recherche Scientifique · Groupe de Physique des Matériaux · Institut National des Sciences Appliquées Rouen Normandie

   Affiliation as printed

   Groupe de Physique des Matériaux, University and INSA of Rouen, CNRS, Normandie University , Avenue de l'université, Rouen 76000 , France

5. Simon Evertz Aachen Materials Chemistry

   Max-Planck-Institut für Nachhaltige Materialien · RWTH Aachen University

   Affiliation as printed

   Department of Metal Physics and Alloy Design, Max Planck Institut für Eisenforschung GmbH , Düsseldorf 40237 , Germany

   Materials Chemistry, RWTH Aachen University , Kopernikusstr 10, Aachen 52074 , Germany

6. Jochen M. Schneider Aachen Materials Chemistry

   RWTH Aachen University

   Affiliation as printed

   Materials Chemistry, RWTH Aachen University , Kopernikusstr 10, Aachen 52074 , Germany

7. Baptiste Gault corresponding

   Max-Planck-Institut für Nachhaltige Materialien · Imperial College London

   Affiliation as printed

   Department of Materials, Royal School of Mines, Prince Consort Road, Imperial College London , London, SW7 2AZ , UK

   Department of Metal Physics and Alloy Design, Max Planck Institut für Eisenforschung GmbH , Düsseldorf 40237 , Germany