January 01, 1968 article The Atom-Probe Field Ion Microscope Review of Scientific Instruments DOI: 10.1063/1.1683116 OpenAlex Authors 0 Author list not loaded yet. Cited by 8 stored of 652 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography 2023 Surface and Coatings Technology article Engineering Advanced Materials Characterization Techniques Open access 18 citations Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy 2023 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 2 citations Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure–activity relationships in electrocatalysts 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 8 citations Opportunities of combinatorial thin film materials design for the sustainable development of magnesium-based alloys 2021 Scientific Reports article Materials Science Magnesium Alloys: Properties and Applications Open access 16 citations Atom Probe Tomography 2021 Elsevier eBooks book-chapter Engineering Advanced Materials Characterization Techniques Open access 399 citations Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography Data 2021 RWTH Publications (RWTH Aachen) article Engineering Advanced Materials Characterization Techniques 5 citations Solving Peak Overlaps for Proximity Histogram Analysis of Complex Interfaces for Atom Probe Tomography Data 2020 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 16 citations Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography 2020 New Journal of Physics article Engineering Advanced Materials Characterization Techniques Open access 29 citations 8 results References 0