November 13, 2024 article Open access Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy Microscopy and Microanalysis DOI: 10.1093/mam/ozae105 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 2 References 2 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Publisher Correction: Unveiling the Re effect in Ni-based single crystal superalloys 2020 Nature Communications erratum Engineering High Temperature Alloys and Creep Open access 7 citations Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy 2023 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access 2 citations 2 results