November 30, 2021 article CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods IEEE Transactions on Device and Materials Reliability DOI: 10.1109/tdmr.2021.3131345 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 51 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Modeling Endurance Degradation of VCM-based 1T1R ReRAM Cell for Circuit Simulations 2026 International Symposium on Quality Electronic Design (ISQED) conference-paper Engineering Advanced Memory and Neural Computing 0 citations A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime 2025 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 1 citations Understanding Transistor Aging Impact on the Behavior of RRAM Cells 2024 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Engineering Advanced Memory and Neural Computing 4 citations 3 results References 0