Testing Resistive Memories: Where are We and What is Missing?

• Modeling Endurance Degradation of VCM-based 1T1R ReRAM Cell for Circuit Simulations

  2026 International Symposium on Quality Electronic Design (ISQED) conference-paper Engineering Advanced Memory and Neural Computing

  0

  citations
• Background

  2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing

  0

  citations
• A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime

  2025 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  1

  citations
• Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

  2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  2

  citations
• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

  10

  citations
• Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware

  2023 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing

  1

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations
• X-Fault: Impact of Faults on Binary Neural Networks in Memristor-Crossbar Arrays with Logic-in-Memory Computation

  2022 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) conference-paper Engineering Advanced Memory and Neural Computing

  10

  citations
• A DfT Strategy for Detecting Emerging Faults in RRAMs

  2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  3

  citations
• Evaluating the Impact of Process Variation on RRAMs

  2021 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing Open access

  15

  citations
• Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

  2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

  14

  citations
• Review of Manufacturing Process Defects and Their Effects on Memristive Devices

  2021 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access

  33

  citations

12 results