November 10, 2016 article Algorithm for Extracting Parameters of the Coupling Capacitance Hysteresis Cycle for TSV Transient Modeling and Robustness Analysis IEEE Transactions on Electromagnetic Compatibility DOI: 10.1109/temc.2016.2621259 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 9 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Introduction to 3D Technologies 2022 Springer eBooks book-chapter Engineering 3D IC and TSV technologies 0 citations High-Level Estimation of the 3D-Interconnect Capacitances 2022 Springer eBooks book-chapter Engineering 3D IC and TSV technologies 0 citations 2 results References 0