November 25, 2015 article Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs IEEE Electron Device Letters DOI: 10.1109/led.2015.2503920 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 78 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Device Simulation 2022 River Publishers eBooks book-chapter Engineering Advancements in Semiconductor Devices and Circuit Design Open access 0 citations Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor Devices 2021 Physical Review Applied article Engineering Semiconductor materials and devices 11 citations 2 results References 0