September 01, 2008 article AlGaN/GaN High Electron Mobility Transistor Structures: Self-Heating Effect and Performance Degradation IEEE Transactions on Device and Materials Reliability DOI: 10.1109/tdmr.2008.2001684 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 33 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access An Auto-Zero Comparator for Monolithic GaN Power Integration 2024 Conference on Ph.D. Research in Microelectronics and Electronics conference-paper Engineering Analog and Mixed-Signal Circuit Design 1 citations 1 result References 0