W2125223858

• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access

  10

  citations
• Improved Arithmetic Performance by Combining Stateful and Non‐Stateful Logic in Resistive Random Access Memory 1T–1R Crossbars

  2023 Advanced Intelligent Systems article Engineering Advanced Memory and Neural Computing Open access

  13

  citations
• Characterization and Test of Intermittent Over RESET in RRAMs

  2023 IEEE Asian Test Symposium (ATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  2

  citations
• Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

  2023 conference-paper Engineering Advanced Memory and Neural Computing

  0

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations
• A DfT Strategy for Detecting Emerging Faults in RRAMs

  2022 IFIP advances in information and communication technology conference-paper Engineering Advanced Memory and Neural Computing Open access

  3

  citations
• Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

  2021 conference-paper Engineering Advanced Memory and Neural Computing cited by 5 patents

  14

  citations

7 results