May 28, 2004 article Memory Fault Modeling Trends: A Case Study Journal of Electronic Testing DOI: 10.1023/b:jett.0000029458.57095.bb OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 48 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Improving the Detection of Undefined State Faults in FinFET SRAMs 2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access 1 citations Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects 2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access 6 citations Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs 2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access 6 citations 3 results References 0