Memristors: Devices, Models, and Applications [Scanning the Issue]

• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

  10

  citations
• Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

  2023 conference-paper Computer Science VLSI and Analog Circuit Testing

  0

  citations
• Evaluating a New RRAM Manufacturing Test Strategy

  2023 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  9

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations
• A DfT Strategy for Detecting Emerging Faults in RRAMs

  2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  3

  citations
• Evaluating the Impact of Process Variation on RRAMs

  2021 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing Open access

  15

  citations
• Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

  2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

  14

  citations
• Review of Manufacturing Process Defects and Their Effects on Memristive Devices

  2021 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access

  33

  citations

8 results