Papers matching “thin films” in X-ray Diffraction in Crystallography 3
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Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Josef Simbrunner, Marten Huck, Armin Moser, Hans‐Georg Steinrück, Roland Resel
7citations -
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access
Jorid Smets, Josef Simbrunner, Mario Fratschko, Víctor Rubio‐Giménez, Rob Ameloot, Hans‐Georg Steinrück, +1 more
5citations -
Towards quantitative evaluation of grazing-incidence X-ray diffraction data2026 Acta Crystallographica Section A Foundations and Advances article Materials Science X-ray Diffraction in Crystallography Open access
F. Gasser, S. John, J. Smets, J. Simmbrunner, M. Fratschko, R. Ameloot, +2 more
0citations
3 results