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Scale correction in submicron computed tomography with a submillimeter field of view2025 Tomography of Materials and Structures article Engineering Advanced Measurement and Metrology Techniques Open access
Marek Zemek, Pavel Blažek, Jakub Šalplachta, Tomáš Zikmund, Michal Petřík, Robert Heinrich Schmitt, +1 more
0citations -
Lattice Deformation at Submicron Scale: X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices2023 Physical Review Applied article Physics and Astronomy Quantum and electron transport phenomena Open access
Cedric Xavier Corley-Wiciak, Marvin Hartwig Zoellner, Ignatii Zaitsev, Ketan Anand, Edoardo M. Zatterin, Yuji Yamamoto, +8 more
15citations
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