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Switching Interacting Particle Systems: Scaling Limits, Uphill Diffusion and Boundary Layer2022 Journal of Statistical Physics book-chapter Mathematics Stochastic processes and statistical mechanics Open access
Simone Floreani, Cristian Giardinà, Frank den Hollander, Shubhamoy Nandan, Frank Redig
15citations -
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations
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